INTEGRATED SOLID-STATE DEVICES AND CIRCUITS LAB.
연세대학교 본교(제1캠퍼스)전기전자공학부
윤홍일 교수
Server on Chip
Built-Off Self Test (BOST)
High-Speed Memory Systems
발행물
전체 논문
10
1
High Speed Back-Bias Voltage (VBB) Generator with Improved Pumping Current
임태건, 이충근, 윤홍일
Electronics, 2020
2
A Negative Charge Pump Using Enhanced Pumping Clock for Low-Voltage DRAM
이충근, 임태건, 윤홍일
Electronics, 2020
3
Variation-Tolerant Sensing Circuit for Ultralow-Voltage Operation of Spin-Torque Transfer Magnetic RAM
조강욱, 윤홍일
IEEE Transactions on Circuits and Systems II: Express Briefs, 2017
4
Single-Error-Correction and Double-Adjacent-Error-Correction Code for Simultaneous Testing of Data Bit and Check Bit Arrays in Memories
차상언, 윤홍일
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY (TDMR), 2014
5
Self-correcting check bit generator of error correction codes for memories
차상언, 윤홍일
ELECTRONICS EXPRESS (ELEX), 2013
6
Single-Error-Correction Code for Simultaneous Testing of Data Bit and Check Bit Arrays for Word-Oriented Memories
차상언, 윤홍일
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY (TDMR), 2013
7
Efficient Implementation of Single Error Correction and Double Error Detection Code with Check Bit Precomputation for Memories
차상언, 윤홍일
Journal of Semiconductor Technology and Science (JSTS), 2012
8
Check-bit-reduced codewords using non-2n data bits for ECC-based self-refresh enhancement techniques in DRAMs
차상언, 윤홍일
ELECTRONICS LETTERS (EL), 2010
9
A Low-Power ECC Check Bit Generator Implementation in DRAMs
차상언, 이윤상, 윤홍일
Journal of Semiconductor Technology and Science (JSTS), 2006
10
, 2006