Electron-Beam Lithography

Model: TESCAN & Raith

Semiconductor Analyzer

Model: B1500A (HPSMU#1/HRSMU#1/MPSMU#4/WGFMU#2/CMU+SCUU)

Atomic Force Microscope

Model: NX10 (Park System)

Lock-in Amplifier

Model: 50 MHz LOCK-IN Amplifier (HF2LI)

Lock-in Amplifier (alternate image)

Vacuum Probe Station

Model: Vacuum Probe Station (VPS) (WIT, VEM-10X)

Low-Frequency Noise Measurement

*Spec.: 20 Hz ~ 20 kHZ, Transistor, Diode, Resistor, OLED etc. - Simultaneous Optical and Electrical Cross Noise Correlation Factor Measurements

Dry Transfer System

Model: Dry transfer system (WIT< DTS-P200)

Optical Microscope

Model: Optical microscope (MIC, S39B SET, - Magnification: 100x, 50x, 20x, 10x)

Lock-in Amplifier (additional image)