Constructing a Multi-Class Classifier using One-Against-One Approach with Different Binary Classifiers

Evaluating the Reliability Level of Virtual Metrology Results for Flexible Process Control: A Novelty Detection-Based Approach

Pre-Launch New Product Demand Forecasting using the Bass Model: A Statistical and Machine Learning-based Approach

One-Class Naive Bayesian Classifier with Genetic Algorithm for Toll Fraud Detection

Probabilistic Local Reconstruction for K-NN Regression and its Application to Virtual Metrology in semiconductor manufacturing

Multivariate Control Chart Based on Hybrid Novelty Scores

Locally Linear Reconstruction Based Missing Value Imputation for Supervised learning

Improved Response Modeling Based on Clustering Under-Sampling, and Ensemble

Support Vector Class Description (SVCD): Classification in Kernel Space

Machine learning-Based Novelty Detection for Faulty Wafer Detection in Semiconductor Manufacturing