발행물
컨퍼런스
32회 한국반도체학술대회
2025
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Analysis of the Impact of Grain Boundary in Diode-Type 3-D NAND Flash Memory Cell
Analysis of Proton-Irradiation Effects on 28nm MOSFETs
Analysis of Work-function Engineering in a Vertical Channel DRAM Cell Transistor
1970
Design Optimization of SiC CMOS FinFET for next-generation system on chip logic applications
Analysis of Leakage-Current-Assisted Polarization Mechanism for Memory Window Expansion in Ferroelectric a-InGaZnOx Thin Film Transistor