발행물
컨퍼런스
32회 한국반도체학술대회
1970
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Analysis of Proton–Induced Electrical Degradation in a-IGZO TFTs under Aerospace Environments
Analysis on Effect of Proton Irradiation on Schottky-Barrier a-IGZO TFTs using TCAD Simulation
2024 반도체공학회 하계학술대회
2024
Investigation of the Row Hammer and Pass Gate Effects According to the Design of the BCAT Structure in DRAM Arrays
2024 전자공학회 하계학술대회
Analysis of Row Hammer and Passing Gate Effect in DRAM Cells by BCAT Structural Design
전기전자재료학회 하계학술대회 SiC 반도체 컨퍼런스
SiC와 b-Ga2O3 Vertical Schottky Barrier Diodes (SBDs)의 양성자 조사에 의한 Displacement Damage 특성 분석