발행물
컨퍼런스
ICSCRM 2024
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Analysis of Deep-Level Defects in 4H-SiC MPS and PiN Diodes
Advancing High-Temperature Performance in Wide-Bandgap Schottky Diodes with Mesa Structures
Investigation of BaTiO3/4H-SiC metal- ferroelectric-semiconductor structures
Temperature-Dependent Hole Scattering in p- Channel 4H-SiC MOSFETs with Different Channel Lengths
2024 한국전기전자학회 하계학술대회
Impact of Annealing on Hysteresis in RF Sputtered AlN/SiC Heterojunction Diodes