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143

141

Impacts of Trapezoidal Fin of 20-nm Double-Gate FinFET on the Electrical Characteristics of Circuits
Ryu, M (Ryu, Myunghwan), Kim, Y (Kim, Youngmin)
JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, 201508

142

Comprehensive Performance Analysis of Interconnect Variation by Double and Triple Patterning Lithography Processes
Kim, Y (Kim, Youngmin), Lee, J (Lee, Jaemin), Ryu, M (Ryu, Myunghwan)
Journal of Semiconductor Technology and Science, 201412

143

A Performance Analysis for Interconnections of 3D ICs with Frequency-Dependent TSV Model in S-parameter
Han, KJ (Han, Ki Jin), Lim, Y (Lim, Younghyun), Kim, Y (Kim, Youngmin)
JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, 201410