발행물
컨퍼런스
International Technical Conference on Circuits/Systems, Computers and Communications
2011.06
,
Design of Gated Twin-Bit (GTB) NAND Flash Memory Considering Gate Induced Drain Leakage (GIDL) Current,
Single Electron Transistor with P-type Sidewall Spacer Gates and SONOS Structure,
Silicon Nanoelectronics Workshop
Retention Characteristics of 3D GAA(Gate-all-around) Charge Trap Flash Memory,
Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices
Novel Three Dimensional (3D) NAND Flash Memory Array Having Tied Bit-line and Ground Select Transistor (TiGer),
하계종합학술대회
Compact Bit-line STacked ARray(STAR),