2010.07

,

Threshold Voltage Roll-off Mechanisms in SONOS Flash Memory in Retention Mode Including Trapped Charge Redistribution Effect,

2010.06

,

Investigation of Current Degradation Induced by Silicide Source/Drain in the nanowire NAND Flash Memory,

2010.06

,

Investigation of Width Dependent Retention Characteristics with GAA(Gate-All-Around) SONOS structure,

2010.06

,

Research of Memory Characteristics of GAA(Gate All Around) and DG(Double Gate) Type Bit Line Stacked Array,

2010.06

,

Study of 3-dimentional stacked vertical NAND falsh memory,