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IEEE Nanotechnology Materials and Devices Conference
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Reliable Extraction of Series Resistance in Silicon Nanowire FETs Using Y-function Technique
2011 IEEE Nanotechnology Materials and Devices Conference
Reliable Extraction of Series Resistance in Silicon Nanowire FETs Using Y-function Technique," 2011 IEEE Nanotechnology Materials and Devices Conference
2011 International Conference on Solid State and Device Materials
Analysis of Bottom Channel Effect in Silicon Nanowire FET based on Bulk-Silicon: Reduction of Parasitic Capacitance caused by SiGe layer
3M NANO
Highly Sensitive BioFETs with Various Nanowire Structure
2011 11th IEEE International Conference on Nanotechnology
Fabrication and Characterization of Gate-All-Around Silicon Nanowire Field Effect Transistors