Optical and electrical characteristics of asymmetric nanowire solar cells
Chang-Ki Baek
JOURNAL OF APPLIED PHYSICS, 201204
92
New Investigation of Hot Carrier Degradation on RF Small-Signal Parameter and Performance in High-k/Metal Gate nMOSFETs
Chang-Ki Baek
IEEE ELECTRON DEVICE LETTERS, 201112
93
Comprehensive Study of Quasi-Ballistic Transport in High-k/Metal Gate nMOSFETs
Chang-Ki Baek
IEEE ELECTRON DEVICE LETTERS, 201111
94
Interfacial-Layer-Driven Dielectric Degradation and Breakdown of HfSiON/SiON Gate Dielectric nMOSFETs
Chang-Ki Baek
IEEE ELECTRON DEVICE LETTERS, 201110
95
Silicon nanowire ion sensitive field effect transistor with integrated Ag/AgCl electrode: pH sensing and noise characteristics
Chang-Ki Baek
Analyst, 201109
96
A 3-D Statistical Simulation Study of Mobility Fluctuations in MOSFET Induced by Discrete Trapped Charges in SiO2 Layer
Chang-Ki Baek
IEEE TRANSACTIONS ON NANOTECHNOLOGY, 201107
97
Characterization and Modeling of 1/f Noise in Si-nanowire FETs: Effects of Cylindrical Geometry and Different Processing of Oxides
Chang-Ki Baek
IEEE TRANSACTIONS ON NANOTECHNOLOGY, 201105
98
C-V Characteristics in Undoped Gate-All-Around Nanowire FET Array
Chang-Ki Baek
IEEE Electron Device Letters, 201102
99
An Analysis of the Field Dependence of Interface Trap Generation under Negative Bias Temperature Instability Stress using Wentzel- Kramers Brillouin with Density Gradient Method
Chang-Ki Baek
Japanese Journal of Applied Physics, 201101
100
Comparison of Series Resistance and Mobility Degradation Extracted from n- and p-Type Si-Nanowire Field Effect Transistors Using the Y-Function Technique