발행물
컨퍼런스
European Solid-State Device Research Conference
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Deterministic simulation of SiGe HBTs based on the Boltzmann equation
International Conference on Simulation of Semiconductor Processes and Devices
A deterministic Boltzmann equation solver for 2D semiconductor devices
Statistical analysis of random telegraph noise in CMOS image sensors
A unified approach for the reliability modeling of MOSFETs
Noise simulation in nanoscale devices based on the non-equilibrium Green’s function formalism