발행물
컨퍼런스
International Conference on Simulation of Semiconductor Processes and Devices
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A physics-based TCAD framework for the noise analysis of RF CMOS circuits under the large-signal operation
Noise in Devices and Circuits
Nonlocal transport and thermal noise of the nano scale MOSFET
Extension of the characteristic potential method for noise calculation and its application to shot noise in semiconductor devices
The physical and numerical implications of the noise modeling method: IFM, CPM, and ERS
Characteristic potential method of noise calculation in semiconductor devices: calculation of 1/f noise in MOS transistors in the ohmic region