발행물
컨퍼런스
International Conference on Simulation of Semiconductor Processes and Devices
,
Surface-potential based compact model for quantum effects in planar and double-gate MOSFET
Physics-based simulation of 1/f noise in MOSFETs under large-signal operation
International Reliability Physics Symposium
2007
Reliability studies on non planar DRAM cell transistor
Physics-based phase noise analysis of CMOS RF oscillators
International Conference on Noise and Fluctuations
2005
Governing equations of the Green’s functions for the short-circuit terminal noise currents in semiconductor devices