Statistical Noise Analysis of CMOS Image Sensors in Dark Condition
Woo, JM[Woo, Jun-Myung], Park, HH[Park, Hong-Hyun], Hong, SM[Hong, Sung-Min], Chung, IY[Chung, In-Young], Min, HS[Min, Hong Shick], Park, YJ[Park, Young June]
IEEE Transactions on Electron Devices, 200911