First Lateral Contact Probing of 55-μm Fine Pitch Micro-Bumps
Kim, CK[Kim, Chang-Keun], Yoon, YH[Yoon, Yong Hoon], Kwon, D[Kwon, Donguk], Kim, SH[Kim, Seunghwan], Yoon, GW[Yoon, Gun-Wook], Rhee, MW[Rhee, Min Woo], Yun, JY[Yun, Jinyeong], Park, I[Park, Inkyu], Yoon, JB[Yoon, Jun-Bo]
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2018