발행물
컨퍼런스
International Test Conference 2012
,
Timing Error Minimization Methouds to DTL2Er Scheme for Channel Bandwidth Enhancement of Low Speed ATE
Korea-Japan EMT/EMC/BE Joint Conference
Equivalent Circuit Modeling of Bulk Current Injection Probe
Asia Pacific International Symposium on EMC 2012
2024.05
Electromagnetic Susceptibility Analysis of ICs using DPI Method with Consideration of PDN
Bulk Current Injection Test Modeling Using an Equivalent Circuit for 1.8V Mobile ICs
The International Conference on Electrical Engineering
2012.07
A Handy Method for Prediction of Common Mode Currents in Printed Circuit Board with Attached Cables