발행물
컨퍼런스
Nano Convergence Conference 2020
2020
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DFT-NEGF simulation to study the impact of interface trap charge in junction-less nanowire transistor
Prediction model for estimating line-edge-roughness (LER)-induced variation in MOSFET
Machine learning technique to time-efficiently estimate the Line-Edge-Roughness (LER)-induced random variation in FinFET
The 27th Korean Conference on Semiconductors
Digital Inverter with Positive Feedback Field Effect Transistor
Sensitivity Analysis of NCFET-based 6-T SRAM