발행물
컨퍼런스
The 27th Korean Conference on Semiconductors
2020
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Investigation of Interface Trap Density by Low Frequency Noise and Subthreshold Slope
Energy-Delay Sensitivity Analysis of NEM Relay Using Negative Capacitance
FBFET-based Ring Oscillators for Neuromorphic Computing
Regression Model for investigating the impact of line-edge-roughness (LER)
Machine-Learning model for predicting the effect of line edge roughness on device performance