발행물
컨퍼런스
The 27th Korean Conference on Semiconductors
2020
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Observation of negative capacitance effect by phase field simulation
Analysis of negative capacitance gate-all-around junctionless nanowire FET considering work function variation
제58회 한국진공학회 동계정기학술대회
Experimental study on the electrical characteristics of ferroelectric-gated FinFET
Experimental investigation on time-resolved electrical characteristic in ferroelectric-gated FinFET
Characteristic analysis of single SiOx layer ReRAM devices with thermal annealing and partial pressure