발행물
컨퍼런스
제28회 한국반도체학술대회 (KCS 2021)
2021
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A New Approach to Estimate the process-induced Random Variation in current-voltage Characteristic of FinFET:Machine-Learning Technique
NANO KOREA 2021
Conventional/large-scale operation metrics to do comprehensive analysis on 8T-SRAM bit cells
Effects of Rapid Thermal Annealing on Pt/Ag/HfO2/Pt Threshold Switching Device
Experimental verification on charge-boosting effect in metal-ferroelectric-metal capacitor
2021 MRS
The impact of body biasing on externally-connected Al:HfO2-based ferroelectric field effect transistor