발행물
컨퍼런스
제58회 한국진공학회 동계정기학술대회
2020
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Investigating the impact of line-edge-roughness (LER) on off-current distribution for FinFET device
Impact of work-function variation on the performance of silicon-on-insulator feedback field-effect transistor
Steep Slope Nanowire Feedback Field Effect Transistor
Steep Slope Silicon-on-insulator Dual-gated Feedback Field Effect Transistor
Prediction model for estimating the effect of line-edge-roughness (LER) on device performance