A Direct Observation of the Distributions of Local Trapped-Charges and the Interface-States near the Drain Region of the Silicon-Oxide-Nitride-Oxide-Silicon Device for Reliable Four-Bit/Cell Operations
An, Ho-Myoung, Zhang, Yongjie, Kim, Hee-Dong, Seo, Yu Jeong, Kim, Byungcheul, Kim, Joo-Yeon, 김태근, An, Ho-Myoung, Zhang, Yongjie, Kim, Hee-Dong, Seo, Yu Jeong, Kim, Byungcheul, Kim, Joo-Yeon, 김태근
Jpn. J. Appl. Phys., 2010