,

A high-efficiency back-bias generator with cross-coupled hybrid pumping circuit for sub-1.5 V DRAM applications

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Characteristics of tunneling nitride grown by electron cyclotron resonance nitrogen plasma nitridation and its application to low voltage EEPROM

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Parametric expression of subthreshold slope using threshold voltage parameters for MOSFET statistical modeling

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Temperature dependent universal hole and electron mobility models for CMOS circuit simulation

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Modeling of current degradation in hot-Electron damaged LDD nMOSFET's