발행물
컨퍼런스
MRS Fall Meeting 2011
2011
,
Structural properties of GaN thin films grown on graphene layers
Resistive Between Interface Atoms and the Resistive switching behavior in Pt/Nb:STO
IUCr 2011 Madrid
Direct measurements of lattice distortion and mapping of point defects
IUMAS-V & ALC`11
Investigation of Second Phase in NiO Bipolar Resistive Switching Memory
EELS Study of the Interface between Al, Ti Metals and Oxide Films