발행물
컨퍼런스
KIEES Academy Summer Workshop
2016.05
,
EMC Design in Mobile Devices
Huwin
2016.12
High-sensitivity RFI Measurement Techniques & Component-level EMI Evaluation Methods
HANA Micron
2016.11
Signal/Power Integrity (SI/PI) Fundamentals
SK Hynix
2016.08
Samsung Electronics
2016.07
Component-level RE/RFI Evaluation Methods