발행물
컨퍼런스
Samsung Electronics
2016.06
,
High-sensitivity RFI Noise Measurement Technologies
IEEE Electrical Design of Advanced Packaging & Systems Symposium (EDAPS 2015)
Publicity Chair
2015.11
High-sensitivity Measurement on RFI Noise Sources
SiSoft High-speed Serial Interface Solution Workshop
2015.09
Challenges in High-speed Interconnects Design and Passive Channel Optimization Techniques
KIEES EMC Korea 2015
2015.07
Radiated Emission and Susceptibility