발행물
컨퍼런스
The 1st International Workshop on Conceptual Modeling for Big Data and Smart Computing–2020 IEEE International Conference on Big Data and Smart Computing
2020
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Kernel rotation forests for classification
2019 INFORMS Annual Meeting
2019
Cost-effective construction of convolutional neural network for wafer map pattern classification
2018 INFORMS Annual Meeting
2018
Defect classification using ensemble convolutional neural network in semiconductor manufacturing
2019 Fall Conference of Korean Institute of Industrial Engineers (KIIE)
Active inspection for cost-effective fault prediction in manufacturing process
2019 Spring Conference of Korean Institute of Industrial Engineers (KIIE)
Active learning of convolutional neural networks for cost-effective wafer map pattern classification