Domain-Adaptive Active Learning for Cost-effective Virtual Metrology Modeling

Adaptive Fault Detection Framework for Recipe Transition in Semiconductor Manufacturing

Active inspection for cost-effective fault prediction in manufacturing process

Active cluster annotation for wafer map pattern classification in semiconductor manufacturing

Active learning of convolutional neural network for cost-effective wafer map pattern classification

Product failure prediction with missing data

Mining the relationship between production and customer service data for failure analysis of industrial products

Learning from single-defect wafer maps to classify mixed-defect wafer maps

TDoA 확률화 이미지를 활용한 딥러닝 기반 타겟 추적 모델

Domain-adaptive active learning for cost-effective virtual metrology modeling