발행물
컨퍼런스
2024 대한산업공학회 춘계공동학술대회
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Enhanced Wafer Bin Map Pattern Recognition with 3D Representation Learning
The 6th International Conference on Artificial Intelligence in Information and Communication
Patch-based Time-Series Anomaly Detection with Cross-Variable Attention
UMAD-G: Unsupervised Multi-modal time series Anomaly Detection via Graph
DSPR-CNN: Direct Set Prediction Region with CNN features
Reinforcement Learning for Time Series Data with Partially Labeled Anomalies