,

Wafer Pattern Recognition Using a 3D Image Processing Method in Semiconductor Manufacturing Process

,

Normalizing Flow 기반의 Continual Learning을 활용한 제조 공정에서의 이상 탐지

,

First Prediction 시점 탐지를 위한 베어링 Degradation 특질 추출

,

TFE-Net: Time and Feature focus Embedding Network for Multivariate-to-Multivariate Time Series Forecasting

,

Interaction-based Fault Detection and Classification Using Randomly Masked 1D Convolutional Neural Network