발행물
컨퍼런스
International Conference on Manufacturing Systems Engineering and Management (ICMSEM 2014)
,
Pattern Recognition using Feature Based Die-Map Clustering in the Semiconductor Manufacturing Process
Survival Analysis based Delivery Time Estimates for Display FAB
대한산업공학회 2013 추계학술대회
셀 레벨에서의 OPTICS 기반 특질 추출을 이용한 칩 품질 예측
생존분석을 이용한 디스플레이 FAB의 반송시간 예측 모형
IEEE 2nd International Congress on Big Data (BigData 2013)
Data Mining Approaches for Packaging Yield Prediction in the Post-Fabrication Process