발행물

논문
특허
저서
컨퍼런스

전체 논문

2601

1181

Investigation of Gate Sidewall Spacer Optimization From OFF-State Leakage Current Perspective in 3-nm Node Device
Donghyun Ryu, Ilho Myeong, Jang-Kyu Lee, Myounggon Kang, Jongwook Jeon, Hyungcheol Shin
IEEE Transactions on Electron Devices, 2019

1182

Fringe Capacitance Modeling in NanoPlate MOSFET Using Conformal Mapping
Jongsu Kim, Myounggon Kang, Jongwook Jeon, Hyungcheol Shin
IEEE Transactions on Electron Devices, 2019

1183

Compact Model Strategy of Metal-Gate Work-Function Variation for Ultrascaled FinFET and Vertical GAA FETs
Kyul Ko, Myounggon Kang, Jongwook Jeon, Hyungcheol Shin
IEEE Transactions on Electron Devices, 2019

1184

Thermal-Aware Shallow Trench Isolation Design Optimization for Minimizin g IOFF in Various Sub-10-nm 3-D Transistors
강명곤
TRANSACTIONS ON ELECTRON DEVICES, 2019

1185

Modeling of Charge Loss Mechanisms during the Short Term Retention Operation in 3-D NAND Flash Memories
Changbeom Woo, Myeongwon Lee, Shin-Keun Kim, Jaeyeol Park, Gil-Bok Choi, Moon-Sik Seo, Keum Hwan Noh, Myounggon Kang, Hyungcheol Shin
2019

1186

Modeling of Lateral Migration Mechanism During the Retention Operation in 3D NAND Flash Memories
Changbeom Woo, Shin-Keun Kim, Jaeyeol Park, Dongiun Lee, Myounggon Kang, Jongwook Jeon, Hyungcheol Shin
2019 Electron Devices Technology and Manufacturing Conference (EDTM), 2019

1187

Analysis of Self Heating Effect in Vertical-channel Field Effect Transistor
Ilho Myeong, Jongwook Jeon, Myounggon Kang, Hyungcheol Shin
2019

1188

BSIM-CMG Modeling for 3D NAND Cell with Macaroni Channel
Minsoo Kim, Ilho Myeong, Juhyun Kim, Myounggon Kang, Jongwook Jeon, Hyungcheol Shin
2019 Electron Devices Technology and Manufacturing Conference (EDTM), 2019

1189

Radiation Tolerant Electronics
Paul Leroux, Teng Wang, Xin Wan, Jin Hu, Hao Li, Yabin Sun, Renrong Liang, Jun Xu, Li‐Rong Zheng, Mohan Liu, Wu Lu, Xin Yu, Xin Wang, Xiaolong Li, Shuai Yao, Qi Guo, Kyungsoo Jeong, Duckhoon Ro, Gwanho Lee, Myounggon Kang, Hyung‐Min Lee, Jan Budroweit, Paul Jaksch, Maciej Sznajder, Bjorn Van Bockel, Jeffrey Prinzie
2019

1190

Correction to “Characteristic Length of Macaroni Channel MOSFET” [Nov 19 1720-1723]
Quan Nguyen-Gia, Myounggon Kang, Jongwook Jeon, Hyungcheol Shin
IEEE Electron Device Letters, 2019