SinWaveFusion: Learning a single image diffusion model in wavelet domain
Jisoo Kim, Jiwoo Kang, Tae-Wan Kim, Heeseok Oh
Image and Vision Computing, 2025
172
Exploration of Interplay between Charge Trapping Dynamics and Polarization Switching in α-In<sub>2</sub>Se<sub>3</sub> Ferroelectric Semiconductor FETs
Minah Park, Jae‐Hyoung Yoo, S H Park, Hongseung Lee, Hyeonjun Song, Soyeon Kim, Seongbin Lim, Sojin Jung, Gang Qiu, Sungjune Park, Tae-Wan Kim, Peide D. Ye, Hagyoul Bae
IEEE Electron Device Letters, 2025
173
Subthermionic Steep-Slope MoS<sub>2</sub>/MoO<sub>3</sub>/MoS<sub>2</sub> Tunneling Field-Effect Transistor with Extremely Low Off-state Current Level
Dong Hyun Seo, Ji Won Heo, Jong Min Song, Hagyoul Bae, Tae-Wan Kim
ACS Applied Electronic Materials, 2025
174
Non-thermal plasma-mediated green synthesis of chitosan-functionalized gold nanoparticles for enhanced cancer immunogenicity
Journal of Industrial and Engineering Chemistry, 2025
175
Feature-Based Beauty Product Search System through Feature Extraction from Product Reviews
Tae-Wan Kim, Soo-Hyeon Park, Hyun Ah Lee
Journal of Digital Contents Society, 2025
176
Correction to “Subthermionic Steep-Slope MoS<sub>2</sub>/MoO<sub>3</sub>/MoS<sub>2</sub> Tunneling Field-Effect Transistor with Extremely Low Off-state Current Level”
Dong Hyun Seo, Ji Won Heo, Jong Min Song, Hagyoul Bae, Tae-Wan Kim
ACS Applied Electronic Materials, 2025
177
Synergistic role of Bi, Ni, and Pd alloying in SAC305 for enhanced IMC suppression and superior thermo-mechanical performance
You-Gwon Kim, Heon-Su Kim, Tae-Wan Kim, Hyeong-Bin Park, Jong‐Whi Park, Yongrae Jang, Bongtae Han, Jun-Hyeong Lee, Jin Gyu Kim, Hak‐Sung Kim
Journal of Materials Research and Technology, 2025
178
Neutron Irradiation-Induced Trap States and Electrical Performance Degradation in ReS2 Field-Effect Transistors
S. Bäck, G. Seo, Ji Won Heo, Hagyoul Bae, Bong-Ki Jung, Tae-Wan Kim
Electronic Materials Letters, 2025
179
Control of silver nanoparticle size and shape in RF-biased inductively coupled plasma systems
Jin-Hoo Seong, Min Young Yoon, Hee Jung Yeom, Yeo Jin Choi, Sung Jin An, Tae-Wan Kim, Jung‐Hyung Kim, Hyo‐Chang Lee
Surfaces and Interfaces, 2025
180
Comparative analysis of charge-trap sensitivity and stability in MoTe <sub>2</sub> and WS <sub>2</sub> field -effect transistors
Gi Dan Shim, Ji Won Heo, Jaewook Yoo, Hagyoul Bae, Tae-Wan Kim