발행물

전체 논문

2601

1871

A Study on the Sintering Behavior of T42 High Speed Steel by Powder Injection Molding (PIM) Process
Dong‐Wook Park, Hye-Seong Kim, Young–Sam Kwon, Kwon‐Koo Cho, Su-Gun Lim, In-Shup Ahn
Journal of Korean Powder Metallurgy Institute, 2012

1872

Vertical-Channel STacked ARray (VCSTAR) for 3D NAND flash memory
Se Hwan Park, Yoon Kim, Wandong Kim, Joo Yun Seo, Byung‐Gook Park
Solid-State Electronics, 2012

1873

Variation of Threshold Voltage and ON-Cell Current Caused by Cell Gate Length Fluctuation in Virtual Source/Drain NAND Flash Memory
Wandong Kim, Yoon Kim, Se Hwan Park, Joo Yun Seo, Do Bin Kim, Byung‐Gook Park
Japanese Journal of Applied Physics, 2012

1874

Novel Three Dimensional (3D) NAND Flash Memory Array Having Tied Bit-line and Ground Select Transistor (TiGer)
Se Hwan Park, Yoon Kim, Wandong Kim, Joo Yun Seo, Hyungjin Kim, Byung‐Gook Park
IEICE Transactions on Electronics, 2012

1875

Three-Dimensional nand Flash Architecture Design Based on Single-Crystalline STacked ARray
김윤, 박세환, 윤장근, 유경창, 신형철, 김완동, 강명곤, 서주연, 박병국, 이종호, 오정훈
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2012

1876

Variable Speed Limit to Improve Safety near Traffic Congestion on Urban Freeways
Youngtae Jo, Yoon Kim, Inbum Jung
International Journal of Fuzzy Systems, 2012

1877

Investigation into the effect of the variation of gate dimensions on program characteristics in 3D NAND flash array
Joo Yun Seo, Yoon Kim, Se Hwan Park, Wandong Kim, Do-Bin Kim, Jong‐Ho Lee, Hyungcheol Shin, Byung‐Gook Park
2012

1878

The Quality of Life of North Korean: Current Status and Understanding
Kim Soo, Kim Kook Shin, Yoon Kim, Lim Soon Hee, Jeong Eun Mee, Park Young Ja
Korea Institute for National Unification eBooks, 2012

1879

A Fault-tolerant Mutual Exclusion Algorithm in Asynchronous Distributed Systems
Yoon Kim
International Journal of Contents, 2012

1880

Method to Mitigate Threshold Voltage and ON-Cell Current Variation Caused by Cell Gate Length Fluctuation in NAND Flash Memory with Virtual Source and Drain
Wandong Kim, Yoon Kim, Sehwan Park, Joo Yun Seo, Do Bin Kim, Byung‐Gook Park
대한전자공학회 학술대회, 2012