Arch NAND Flash Memory Array With Improved Virtual Source/Drain Performance
Wandong Kim, Jung Hoon Lee, Jang-Gn Yun, Seongjae Cho, Donghua Li, Yoon Kim, Doo-Hyun Kim, Gil Sung Lee, Sehwan Park, Won‐Bo Shim, Jong‐Ho Lee, Hyungcheol Shin, Byung‐Gook Park
IEEE Electron Device Letters, 2010
2062
Program/Erase Model of Nitride-Based NAND-Type Charge Trap Flash Memories
Doo-Hyun Kim, Seongjae Cho, Dong Hua Li, Jang-Gn Yun, Jung Hoon Lee, Gil Sung Lee, Yoon Kim, Won‐Bo Shim, Se Hwan Park, Wandong Kim, Hyungcheol Shin, Byung‐Gook Park
Japanese Journal of Applied Physics, 2010
2063
Simulation Study on Dependence of Channel Potential Self-Boosting on Device Scale and Doping Concentration in 2-D and 3-D NAND-Type Flash Memory Devices
Seongjae Cho, Jung Hoon Lee, Yoon Kim, Jang-Gn Yun, Hyungcheol Shin, Byung‐Gook Park
IEICE Transactions on Electronics, 2010
2064
수직형 4-비트 SONOS를 이용한 고집적화된3차원 NOR 플래시 메모리
김윤, 조성재, 박병국, 윤장근
전자공학회논문지-SD, 2010
2065
Highly Scalable 3-D NAND-NOR Hybrid Type Dual-Bit per Cell Flash Memory Device with Additional Cut-off Gate
Seongjae Cho, Won‐Bo Shim, Il Han Park, Yoon Kim, Byung‐Gook Park
Journal of the Korean Physical Society, 2010
2066
Integration of Workflow and Rule Engines for Clinical Decision Support Services
Jae Hoon Lee, Jeong‐Ah Kim, Insook Cho, Yoon Kim
Studies in health technology and informatics, 2010
2067
A Real Time Flame and Smoke Detection Algorithm Based on Conditional Test in YCbCr Color Model and Adaptive Differential Image
Doo‐Hee Lee, Jaewook Yoo, Kanghee Lee, Yoon Kim
Journal of the Korea Society of Computer and Information, 2010
2068
Quorum Based Mutual Exclusion in Asynchronous Systems with Unreliable Failure Detectors
Sung Hoon Park, Yoon Kim, Jong-Ho Han, Jong-Sul Park
2010
2069
A New Cone-Type 1T DRAM Cell(Session 2A : Memory 1)
Gil Sung Lee, D. Kim, Jang-Gn Yun, Jung H. Lee, Yoon Kim, Jong‐Ho Lee, Hyungcheol Shin, Byung‐Gook Park
SIAM International Conference on Data Mining, 2010
2070
Threshold Voltage Roll-off Mechanisms in SONOS Flash Memory in Retention Mode Including Trapped Charge Redistribution Effect(Session 2A : Memory 1)
D. Kim, Gil Sung Lee, Seongjae Cho, Jung-Hoon Lee, Jang-Gn Yun, Dong Hua Li, Yoon Kim, Se Hwan Park, Shim Won Bo, Wandong Kim, Byung‐Gook Park
SIAM International Conference on Data Mining, 2010