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685
3D NAND Flash Memory의 Remnant Polarization(Pr)과 Saturated Polarization(Ps)에 따른 Retention 특성 분석
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j.inst.Korean.electr.electron.eng., 2022
686
Fowler–Nordheim Stress-Induced Degradation of Buried-Channel-Array Transistors in DRAM Cell for Cryogenic Memory Applications
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IEEE Transactions on Electron Devices, 2022
687
Forming-Free Tunable Analog Switching in WOx/TaOx Heterojunction for Emulating Electronic Synapses
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Materials, 2022
688
Optimal Bias Condition of Dummy WL for Sub-Block GIDL Erase Operation in 3D NAND Flash Memory
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Electronics, 2022
689
Synaptic plasticity features and neuromorphic system simulation in AlN-based memristor devices
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Journal of Alloys and Compounds, 2022
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