발행물
컨퍼런스
Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices
2016
,
Reconfigurable U-shape Tunnel FET
2010
Investigation of Current Degradation Induced by Silicide Source/Drain in the nanowire NAND Flash Memory
하계 종합 학술발표회 논문집
Investigation of Width Dependent Retention Characteristics with GAA(Gate-All-Around) SONOS structure
Research of Memory Characteristics of GAA(Gate All Around) and DG(Double Gate) Type Bit Line Stacked Array
Study of 3-dimentional stacked vertical NAND falsh memory