발행물
컨퍼런스
IEEE International NanoElectronics Conference
2010
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Comparative Analysis of Trap-based Program/Erase Behaviors with Tunnel Dielectric for SONOS Flash Memory
2009 IEEK Summer conference
Virtual Source/Drain을 가지는 Folded NAND Flash Memory 영향
AVS 56th International Symposium and Exhibition
2013
Scaling Behaviors of Silicon Nitride Layer for Charge Trapping Memory
2009 IEEK fall conference
2009
3차원 구조의 차단 게이트를 이용한 2-비트 낸드플래시 메모리의 pinch-off 현상에 따른 최적 읽기 구동 방법
10th Annual Non-Volatile Memory Technology Symposium
2028
Dependence of Program and Erase Speeds on Bias Conditions for Fully Depleted Channel of Vertical NAND Flash Memory Devices