발행물
컨퍼런스
WiPDA Asia 2023
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Deep Level Defects in 4H-SiC Schottky Barrier Diodes and PiN and JBS Diodes
Effect of Post-Deposition Annealing on Electrical Properties of Lithium Phosphate on Silicon Carbide
Effects of High-k Field Plate on Vertical β-Ga2O3 Schottky Barrier Diodes
Effect of Post Deposition Annealing on the Electrical Characteristics of NiO/4H-SiC and Cu2O/4H-SiC PiN Diodes Deposited by RF-Sputtering
2023년 한국전기전자학회 하계학술대회
Effects on P-type doping concentration and Trench Tilts of NiO/Ga2O3 PiN Diodes