High Inversion Current in Silicon Nanowire Field Effect Transistors

SiC JMOSFETs for high-temperature stable circuit operation

Simulation study of 4H-SiC Junction-gated MOSFETs from 300K to 773K

Influence of Buffer Layer Thickness on Memory Effects of SrBi2Ta2O9/SiN/Si Structures

Nonvolatile current-sensing device in all-oxide Pb(Zr,Ti)O3/BaRuO3 structure

Ferroelectric Pb(Zr,Ti)O3/Al2O3/4H-SiC Field Effect Transistor

Combination of JFET and MOSFET devices in 4H-SiC for high-temperature stable circuit operation

Simulation and Measurement of Switching Characteristics of 4H-SiC buried-gate JFETs

Electrical characteristics of metal-oxide-semiconductor capacitors on plasma-etch damaged silicon

Influence of trenching effect on the characteristics of buried-gate SiC junction field-effect transistors