발행물
컨퍼런스
IEEE Proceedings of the SMACD'12
2012
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Simple and Accurate Modeling of Double-Gate FinFET Fin Body Variations
IEEE Proceedings of the ICICDT'12
32nm FinFET-based 0.7-to-1.1 V Digital Voltage Sensor with 50mV Resolution
the 19th Korean Conference on Semiconductors
A Simple and Accurate Modeling of Non-rectilinear Gate Shape with Trapezoidal Approximation
24th International Microprocesses and Nanotechnology Conference (MNC2011)
2011
Effects of Contact Size and Schottky Barrier Height on Nanoscale Contact Resistance
IEEE Proc. International SLIP workshop
Performance and Power Analysis of Through Silicon Vias based 3D ICs Integration