발행물
컨퍼런스
Proc. SPIE
2008
,
Shaping Gate Channels for Improved Devices
Proc. ASPDAC
Investigation of Diffusion Rounding for Post-Lithography Analysis
Proc. Design Automation Conference (DAC) WACI
2007
Line End Shortening is not Always a Failure
Simple and Accurate Models for Capacitance Increment due to Metal Fill Insertion
2006
Self-Compensating Design for Reduction of Timing and Leakage Sensitivity to Systematic Pattern Dependent Variation