Special Issue on "New Simulation Methodologies for Next-Generation TCAD Tools" Foreword
Hong, SM[Hong, Sung-Min], Jungemann, C[Jungemann, Chri, Bonani, F[Bonani, Fabrizio], Cea, SM[Cea, Stephen M.], Gnani, E[Gnani, Elena], Jin, S[Jin, Seonghoon], Liu, XY[Liu, Xiaoyan], Moroz, V[Moroz, Victor], Verhulst, A[Verhulst, Anne]
IEEE Transactions on Electron Devices, 202111