발행물
컨퍼런스
IEEE Nuclear and Space Radiation Effects Conference (NSREC)
2015.07
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An Investigation of the SET Response of Devices and Differential Pairs in a 32-nm SOI CMOS Technology
An Investigation of Single-Event Effect Modeling Techniques for a SiGe RF Low-Noise Amplifier
The Role of Negative Feedback Effects on Single-Event Transients in SiGe HBT Analog Circuits
Single-Event Effects in a W-band (75-110 GHz) Radar Down-Conversion Mixer Implemented in 90 nm, 300 GHz SiGe HBT Technology
2014.07
Radiation-Hardened RF Low-Noise Amplifiers Using Inverse-Mode SiGe HBTs