발행물
컨퍼런스
IEEE Microelectronics Design and Test Symposium (MDTS)
2021.05
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Invited: Design for Testability of a CMOS Dynamic Bias Comparator for Through-Wafer Two-Photon Absorption Pulsed-Laser Testing
International Conference on Electronics, Information, and Communication (ICEIC)
2022.01
SMART-DQN: Circuit-Design Optimization Algorithm via Success-Memory and Regeneration-Set Training
IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)
Application of Device Degradation Model to LNA Analysis
Committee on Space Research (COSPAR) Scientific Assembly
2021.07
The Preliminary Test of Search-Coil Magnetometer System with ASIC Devise
Asia-Pacific Workshop on Advanced Semiconductor Devices (AWAD)
2010.07
Design of Millimeter-Wave Active Balun with Minimized Gain and Phase Imbalances