발행물
컨퍼런스
Asia-Pacific Workshop on Advanced Semiconductor Devices (AWAD)
2010.07
,
A Framework for Evaluation and Analysis of Radiation-Induced Errors in NAND/SSD Systems with MQSim
Design of Robust Clock-Tree Circuit with Soft-Error Recovery Function
Design of Radiation-Hardened Double-Latch-Based Comparator for Extreme-Environment Applications
Suppression of Single-Event Effects Using Radio-Frequency Choke Inductors in High-Frequency Analog Circuits
Transient-Monitoring Technique for Voltage-Controlled Oscillator