SiGe HBT Profiles with Enhanced Inverse-Mode Operation and Their Impact on Single-Event Transients
Z. E. Fleetwood, A. Ildefonso, G. N. Tzintzarov, B. Wier, U. Raghunathan, M.-K. Cho, I. Song, M. T. Wachter, D. Nergui, A. Khachatrian, J. H. Warner, P. McMarr, H. Hughes, E. Zhang, D. McMorrow, P. Paki, A. Joseph, V. Jain, J. D. Cressler
IEEE Transactions on Nuclear Science, 2018