발행물
컨퍼런스
2019 한국반도체학술대회
2019
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The Experimental Study of the Negative Capacitance in FD-SOI device
Effect of Process-Induced Line Edge Roughness in Gate-all-around FET
한국반도체학술대회 2019
Theoretical Study for Ferroelectric-Gated Nano-Electro-Mechanical Diode Non-Volatile Memory Cell
Study of Random Dopant Fluctuations Effects in PNPN Feedback FET
Experimental Investigation on Drain-Induced-Barrier-Lowering in Hysteresis-Free Ferroelectric-Gated FinFET