발행물
컨퍼런스
한국반도체학술대회 2019
2019
,
Impact of Ferroelectric Polarization Swtiching on FD-SOI Device
Study of the Reverse Sweep Operation of Positive Feedback Field Effect Transistor
Effect of Process-Induced Line Edge Roughness on Performance of Gate-All-Around FET
Experimental Study Of Negative Capacitance FinFET Device
ICEIC 2019 : The 18th International Conference on Electronics, Information, and Communication
Various Device Structures for Steep Switching Silicon-On-Insulator Feedback Field Effect Transistor